Surface characterization of Asian lacquers using surface metrology and data science: introducing the roughness spectrum

Authors

Ravines Patrick, Buffalo State University
H. David Sheets, Merrimack CollegeFollow
Marianne Webb, Webb Conservation Services, Vancouver, British Columbia, Canada
Joy Mazurek, Getty Conservation Institute
Michael R. Schilling, Getty Conservation Institute
Herant Khanjian, Getty Conservation Institute

Document Type

Article

Publication Title

Surface Topography: Metrology and Properties

Publication Date

5-28-2025

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.