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Description

The design, implementation, and testing of an ESP32 based semiconductor burn in platform. The system applies controlled logic patterns to digital devices under test, monitors outputs behavior, measures supply current, records temperature, and streams results to a graphical user interface through MQTT. A companion universal static IC test board concept is also proposed to support truth table verification of additional logic devices. I’ll be also using a semiconductor board from the company that I work at to demonstrate the flow process.

Publication Date

4-30-2026

ESP32-Based Burn-In & Stress Testing System for Digital IC Reliability

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